Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements

摘要

Torsional harmonic cantilevers allow measurement of time varying tip-sampleforces in tapping-mode atomic force microscopy. Accuracy of these forcemeasurements is important for quantitative nanomechanical measurements. Here wedemonstrate a method to convert the torsional deflection signals into acalibrated force waveform with the use of non-linear dynamical response of thetapping cantilever. Specifically the transitions between steady oscillationregimes are used to calibrate the torsional deflection signals.